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Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 / edited by C.J. Kiely.
Τύπος υλικού:
ΚείμενοΣειρά: Institute of Physics conference series ; no. 161.Λεπτομέρειες δημοσίευσης: Bristol ; Philadelphia : Institute of Physics Pub., �1999.Περιγραφή: 1 online resource (xvii, 632 pages) : illustrationsΤύπος περιεχομένου: - text
- computer
- online resource
- 0585347042
- 9780585347042
- 502/.8/25 21
- QH212.E4 E3798 1999eb
Περιεχόμενα:
Section 1 Plenary lectures -- Section 2 Interfaces and surfaces -- Section 3 Scanning electron microscopy -- Section 4 Electron crystallography -- Section 5 Analytical electron microscopy -- Section 6 High resolution electron microscopy -- Section 7 Advanced scanning probe techniques -- Section 8 Ceramics/carbon/composites -- Section 9 Metals/intermetallics -- Section 10 Catalysts/sensors/environmental materials -- Section 11 Semiconductors/superconductors.
Δεν αντιστοιχούν φυσικά τεκμήρια σε αυτήν την εγγραφή
Includes bibliographical references and indexes.
Section 1 Plenary lectures -- Section 2 Interfaces and surfaces -- Section 3 Scanning electron microscopy -- Section 4 Electron crystallography -- Section 5 Analytical electron microscopy -- Section 6 High resolution electron microscopy -- Section 7 Advanced scanning probe techniques -- Section 8 Ceramics/carbon/composites -- Section 9 Metals/intermetallics -- Section 10 Catalysts/sensors/environmental materials -- Section 11 Semiconductors/superconductors.
Print version record.
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