Applied logistic regression / David W. Hosmer, Stanley Lemeshow.
Τύπος υλικού:
ΚείμενοΣειρά: Wiley series in probability and statistics. Texts and references sectionΛεπτομέρειες δημοσίευσης: New York : Wiley, c2000.Έκδοση: 2η έκδΠεριγραφή: 1 ηλεκτρονική πηγή (xii, 375 σ.) : εικISBN: - 0471654027
- 9780471654025
- 9780471722144
- 0471722146
- 0471673803
- 9780471673804
- 519.5/36 22
- QA 37
"A Wiley-Interscience publication."
Includes bibliographical references (pages 354-367) and index.
Introduction to the logistic regression model -- Multiple logistic regression -- Interpretation of the fitted logistic regression model -- Model-building strategies and methods for logistic regression -- Assessing the fit of the model -- Application of logistic regression with different sampling models -- Logistic regression for matched case-control studies -- Special topics.
In this revised and updated edition, the authors continue to provide an accessible introduction to the logistic regression model while incorporating advances of the last decade, including a variety of software packages for the analysis of data sets. They extend the discussion from biostatistics and epidemiology to cutting-edge applications in data mining and machine learning, guiding readers step-by-step through the use of modeling techniques for dichotomous data in diverse fields. Ample new topics and expanded discussions of existing material are accompanied by real-world examples-with extensive data sets available over the Internet.
